Composite material C-scan inspection, Delamination detection, Adhesion failure inspection, Olympus near-wall phased array probe_供应产品_Tuduo (Shanghai) Testing Technology Co., Ltd. 
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Tuduo (Shanghai) Testing Technology Co., Ltd.

Spectrometers, Phased Array, Ultrasonic Flaw Detectors, Endoscopes

18019490612 13918558304

Composite material C-scan inspection, Delamination detection, Adhesion failure inspection, Olympus near-wall phased array probe

产品Price 30000.00/Set

最小起订Quantity:1 Set 供货总Quantity: 10000 Set

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Location:
Shanghai
有效期至:
长期有效
最后更新:
2022-11-30 17:10

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Product Details

Near-wall phased array probe


Near-wall probes have shorter blind spots (the distance from the center of the first and last chips to the nearest probe housing edge is 1.5mm). They are highly suitable for composite material channel detection and composite material C-scan inspection (delamination, debonding, and porosity).


Advantages and Features

  • Shorter blind zones at both ends (the distance from the center of the first and last chip to the nearest probe housing edge is 1.5mm)

  • Excellent for composite material channel inspection

  • C-scan inspection for composite materials (delamination, debonding, porosity)






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