CJW-2000 Microcomputer-Controlled Fluorescent Magnetic Particle Testing Machine

CJW-2000 Model Microcomputer-Controlled Fluorescent Magnetic Particle Inspection Machine:
The CJW-2000 microcomputer-controlled fluorescent magnetic particle inspection machine is designed based on the principle of magnetic particle inspection machines and in accordance with the requirements of JB/T8290-1998. It is suitable for inspecting shaft-type components made from various magnetic materials magnetized with alternating current. It can detect minute defects such as cracks and inclusions on the surface and near the surface of the components caused by forging, quenching, grinding, and fatigue. It allows for circumferential, longitudinal, and composite magnetization as well as automatic demagnetization of the workpieces.
CJW-2000 Type Microcomputer-Controlled Fluorescent Magnetic Particle Inspection Machine Main Technical Performance Indicators:
1. Magnetization Method: Axial Magnetization, Longitudinal Magnetization, Composite Magnetization
2. Magnetization Current: Continuously adjustable from 0-2000A in the circumferential standard load condition, and from 0-18000AT in the longitudinal direction.
3. Electrode Spacing: 0-1600mm
4. pneumatic clamp: 50mm clamp action
5. Inspection Rhythm: 15S per piece
6. Magnetization Effect: A-Type 2# 15/50 sample shows clear magnetization.
7. Demagnetization Effect: Not greater than 240A/M (3GS)
8. UV Intensity: Not less than 1500 μW/cm² at a distance of 381mm from the UV lamp to the workpiece.
9. Power Supply: 3-phase, 4-wire, 380V±10%, 50Hz.