What are the differences between a white light interferometer and a laser interferometer?

Although both laser interferometers and white light interferometers belong to a large category of interferometers, there are significant differences between them! Below, the editor will inform you of these differences.

Laser Interference.

Laser Interferometry Based on the Michelson Interferometer Principle

The laser beam output from the laser interferometer's main unit is split into two beams (linearly polarized light) by a spectroscope.

(2) Due to the identical frequencies and consistent vibration directions of the two laser beams, with no change in phase difference, the interference conditions are formed as the two beams reflect off mirrors parallel to the emitted light (red line).

(3) Each half-wavelength shift of the conical mirror produces a complete light and dark interference. The number of interference fringes measured is multiplied by the laser half-wavelength.

Through research into measuring equipment for machine tools, linear motors, slides, molds, automation equipment, and robots, the application of laser interferometry can be observed from the principle of laser interference.

White interference.

The White Light Interferometer utilizes the principle of white light interference technology. It involves expanding and collimating the light emitted from the light source, splitting it into two beams using a diffraction grating. One beam reflects off the surface being measured and the other passes through the interference of the beams, measuring the three-dimensional shape of the surface.

Utilizing the white light interference method to measure three-dimensional microstructures. Primarily used for semiconductor manufacturing and packaging process testing, 3C electronic glass screens and their precision accessories, optical processing, micro/nano materials and manufacturing, automotive parts, and manufacturing execution system equipment. Capable of measuring the surface of various objects ranging from ultra-smooth to rough, and from low to high reflectivity. It provides roughness, flatness, microscopic geometric profiles, and curvature measurements from the nanoscale to the micrometer scale. Offers over 300 2D and 3D parameters as evaluation standards for ISO/ASME/EUR/GBT international and domestic standards.

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