
价 格Negotiable
最小起订0 Piece库存0 Piece
Fully Automatic Freezing-Thawing
Negotiable
Humidity and Temperature Control
Negotiable
JB Fungus Test Chamber
Negotiable
Large freeze-thaw tester
Negotiable
Precision Constant Temperature an
Negotiable
Stacked Constant Temperature and
Negotiable
UV aging box
Negotiable
Platinum恒温恒湿箱
Negotiable
Computer Constant Temperature and
Negotiable
Mini Constant Temperature and Hum
Negotiable
High and Low Temperature Shock Test Chamber
One,Meets Standards:
u GB2423.22 Temperature Change Test, Test N
u GB2423.1-89 Basic Test Procedures for Electrical and Electronic Products: Test A: Low Temperature Test Method
u GB2423.2-89 Basic Test Procedures for Electrical and Electronic Products: Test B: High-Temperature Test Method
u GB/T 2423.1 Electrical and Electronic Products Environmental Testing Part 2: Test Methods Test A: Low Temperature
u GB/T 2423.2 Electrical and Electronic Products Environmental Testing Part 2: Test Methods Test B: High Temperature
u GB/T 2423.22 Electrical and Electronic Products Environmental Testing Part 2: Test Methods Test N: Temperature Change
u GB/T 5170.2 Environmental Test Equipment for Electrical and Electronic Products - Inspection Methods: Temperature Test Equipment
II. Technical Specifications:
1Temperature Range: -20℃/-40℃/-55℃/-65℃ to +150℃
2High and low temperature zone temperature range: High temperature zone +60℃~+200℃
Refrigerated Zone 0°C~-70℃
3Temperature Exposure Range: High-Temperature Test Zone +60℃~+150℃
Low-Temperature Test Zone 0℃~-40℃
4Temperature Limit: +200℃
5Minimum Temperature: -75℃
6Temperature Deviation: ±2℃
7Temperature fluctuation: ±0.5℃
8Recovery Time to Temperature: 5 min
9Temperature recovery conditions: 3-5 minutes.
10Sample transfer method: Pneumatic
11Power: AC380V±10% / 50/60Hz + protective grounding
3. Model and Inner Box Dimensions (W x H x D)
ZT-30A-SW 300mm x H 350mm x D 300mm
ZT-50A-S350mm W x 400mm H x 350mm D
ZT-80A-S400mm W x 500mm H x 400mm D
ZT-150A-S500mm W x 600mm H x 500mm D
ZT-252A-S W60"W x 70"H x 60"D
IV. Equipment Structure:
1Test Chamber Structure: The test chamber is designed with an integrated modular structure, where the test chamber consists of a high-temperature testing section located at the lower rear.
Box, the low-temperature test chamber located at the upper rear, the refrigeration unit cabinet at the rear, and the electrical control cabinet on the left rear panel
This system is composed of. This method features a compact, space-saving design with an aesthetically pleasing appearance, and the refrigeration unit is housed in a separate unit box.
Within the body.
2Outer material of the box: Electrostatically spray-painted baked varnish treatment on cold-rolled steel plate/SUS304 stainless steel plate
3Interior material of the box: SUS304 stainless steel plate
4Insulation Materials: Rigid Polyurethane Foam Grade 1
5Cable passage holes: Sliding cable passage tubes are installed at the top of the sample stand and the top of the high-temperature test chamber.
6Sample Rack Load Capacity: ≥3Kg.




www.114global.com © Zhongshang 114 Hebei Network Technology Co., Ltd.Address: Room 6009, Oriental New World Center, No.118 East Zhongshan Road, Qiaoxi District, Shijiazhuang City, Hebei ProvincePlatform Service Hotline: 4006299930

Phone Consultation