Develop and utilizeMOSFETs, IGBTs, diodes, and other high-power devices require comprehensive device-level testing, including breakdown voltage, on-state current, and capacitance measurements. The Keithley parameter waveform recorder (replacing the original transistor curve tracer) supports all device types and test parameters. Keithley parameter waveform recording offers high-power synchronous current-voltage curve testing (IV curve testing), capacitance-voltage curve testing (CV curve testing), and high-power pulse IV curve measurements.