Probe Station, Automatic Probe Station, Wafer Probe Stati...
The microelectronics undergraduate teaching platform is designed to cultivate experimental skills for students in the microelectronics major in testing the parameter characteristics of semiconductor devices. By testing Wafer bare chip Dies, students can master the electrical properties and working principles of basic devices such as MOSFETs, BJTs, and DIODEs.
Parameters available for testing include:
IV Parameters: BVdss, Vth, Vgs, Ids, Rds input-output characteristic curves, transfer curves, etc.
CV Parameters: Cox, t, Ciss, C-V characteristic curve, QSCV, HFCV curve, doping concentration, etc.
Test Platform: Comprised of the Keysight B1500A semiconductor device analyzer and MPS-150B manual analysis probe stage
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