
价 格Negotiable
最小起订0 Piece库存0 Piece
JB Fungus Test Chamber
Negotiable
High and Low Temperature Shock Te
Negotiable
GJB 150.10A Fungus Test Chamber
Negotiable
Guangdong UV Aging Box
Negotiable
Mini High and Low Temperature Sho
Negotiable
Constant Temperature and Humidity
Negotiable
Price of Freezing and Thawing Tes
Negotiable
Temperature and Humidity Control
Negotiable
Constant Temperature and Humidity
Negotiable
GJB 150.10A Fungus Test Machine
Negotiable
High and Low Temperature Shock Test Chamber
One,Meets Standards:
u GB2423.22 Temperature Variation Test, Test N
u GB2423.1-89 Electrical and Electronic Products Basic Test Procedures Test A: Low Temperature Testing Method
u GB2423.2-89 Basic Test Procedures for Electrical and Electronic Products: Test B: High Temperature Test Method
u GB/T 2423.1 Electrical and Electronic Products Environmental Testing Part 2: Test Methods Test A: Low Temperature
u GB/T 2423.2 Electrical and Electronic Products Environmental Testing Part 2: Test Methods Test B: High Temperature
u GB/T 2423.22 Electrical and Electronic Products Environmental Testing Part 2: Test Methods Test N: Temperature Change
u GB/T 5170.2 Electrical and Electronic Products Environmental Test Equipment Inspection Methods; Temperature Test Equipment
II. Technical Specifications:
1Temperature Range: -20℃/-40℃/-55℃/-65℃ to +150℃
2High and low temperature zone temperature range: High temperature zone +60℃~+200℃
Low Temperature Zone 0℃~-70℃
3Temperature Exposure Range: High Temperature Test Area +60℃~+150℃
Low Temperature Test Area - 0℃~-40℃
4Temperature Limit: +200℃
5Minimum Temperature: -75℃
6Temperature Deviation: ±2℃
7Temperature fluctuation: ±0.5℃
8Recovery Time: 5 min
9Recovery temperature conditions: 3-5 minutes
10Sample transfer method: Pneumatic
11Power: AC380V±10% / 50/60Hz + Protective Earth
Section 3: Model and Inner Carton Dimensions (W x H x D)
ZT-30A-S300mm (W) x 350mm (H) x 300mm (D)
ZT-50A-SW 350mm x H 400mm x D 350mm
ZT-80A-SW 400mm x H 500mm x D 400mm
ZT-150A-S500mm W x 600mm H x 500mm D
ZT-252A-S W600mm (W) x 700mm (H) x 600mm (D)
IV. Equipment Structure:
1Test Chamber Structure: The test chamber employs an integrated modular structure, where the chamber consists of a high-temperature test section located at the rear lower part.
Box, the low-temperature test chamber located at the upper rear, the refrigeration unit cabinet at the rear, and the electrical control cabinet on the left rear panel.
This system is composed of. This method features a compact, space-saving design with an aesthetically pleasing appearance, where the refrigeration unit is housed in an independent unit box.
Within the body.
2Outer material of the box: Electrostatic-proof spray-painted varnished cold-rolled steel / SUS304 stainless steel plate
3Interior material of the box: SUS304 stainless steel plate
4Insulation Materials: Hard Polyurethane Foam Grade 1
5Cable entry holes: Sliding cable entry tubes are installed at the top of the sample stand and the top of the high-temperature test chamber.
6Sample Rack Load Capacity: ≥3Kg.




www.114global.com © Zhongshang 114 Hebei Network Technology Co., Ltd.Address: Room 6009, Oriental New World Center, No.118 East Zhongshan Road, Qiaoxi District, Shijiazhuang City, Hebei ProvincePlatform Service Hotline: 4006299930

Phone Consultation